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Chih-Chung Huang
Chih-Chung Huang
GlobalFoundries
Electronic engineering
Engineering
Process window
Voltage
Failure rate
3
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2
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Creative Use of Vector Scan for Efficient SRAM Inspection
2020
ASMC | Advanced Semiconductor Manufacturing Conference
Oliver D. Patterson
Hsiao-Chi Peng
Haokun Hu
Chih-Chung Huang
Panneer Selvam Venkatachalam
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Mask qualification of a shifted gate contact issue by physical e-beam inspection and high landing energy SEM review : DI: Defect Inspection and Reduction
2019
ASMC | Advanced Semiconductor Manufacturing Conference
John G. Sheridan
Hsiao-Chi Peng
Chih-Chung Huang
Victor Aristov
Hoang Nguyen
Yashdeep Khopkar
A. Jain
Jay Shah
Felix Levitov
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Rapid In-line Process Window Characterization Using Voltage Contrast Test Structures for Advanced FinFET Technology Development
2019
ASMC | Advanced Semiconductor Manufacturing Conference
Weihong Gao
Jeonghee Kim
Hsiao-Chi Peng
Chih-Chung Huang
Oliver D. Patterson
Yu-Chi Su
Hsiang Ting Yeh
Sean Starr-baier
Haokun Hu
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Citations (2)
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