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Masahiko Niwayama

Panasonic

4

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51

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Reliability of Diode-Integrated SiC Power MOSFET(DioMOS)

2016 Microelectronics Reliability
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Novel SiC power MOSFET with integrated unipolar internal inverse MOS-channel diode

2011 IEDM | International Electron Devices Meeting
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High density plasma flood system for wafer charge neutralisation

1999
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