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Atsushi Ohoka
Atsushi Ohoka
Panasonic
Electronic engineering
Communication channel
Engineering
MOSFET
Threshold voltage
4
Papers
23
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Reduction of RonA retaining high threshold voltage in SiC DioMOS by improved channel design
2018
ISPSD | International Symposium on Power Semiconductor Devices and IC's
Atsushi Ohoka
Masao Uchida
Tsutomu Kiyosawa
Nobuyuki Horikawa
Kouichi Saitou
Yoshihiko Kanzawa
Haruyuki Sorada
Kazuyuki Sawada
Tetsuzo Ueda
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Reliability of Diode-Integrated SiC Power MOSFET(DioMOS)
2016
Microelectronics Reliability
Osamu Kusumoto
Atsushi Ohoka
Nobuyuki Horikawa
Kohtaro Tanaka
Masahiko Niwayama
Masao Uchida
Yoshihiko Kanzawa
Kazuyuki Sawada
Tetsuzo Ueda
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Citations (8)
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