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H.L. Li
H.L. Li
Chartered Semiconductor Manufacturing
Computer science
Nanoprobing
Optoelectronics
Materials science
ic devices
3
Papers
2
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Challenges Facing the Detection of Leakage Current in Integrated Circuit (IC) Devices
2009
S.L. Toh
E. Hendarto
J. Sudijono
P.K. Tan
Y.W. Goh
H.B. Lin
Q. Deng
H. Tan
L. Zhu
Q.F. Wang
H.L. Li
R. He
J. Lam
Z.H. Mai
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Electrical Characterization of Different Failure Modes in Sub-100 nm Devices Using Nanoprobing Technique
2009
E. Hendarto
S.L. Toh
J. Sudijono
P.K. Tan
H. Tan
Y.W. Goh
L. Zhu
Q. Deng
H.B. Lin
R. He
H.L. Li
Z.H. Mai
J. Lam
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Physical Failure Analysis Techniques and Studies on Vertical Short Issue of 65nm Devices
2008
P.K. Tan
Z.H. Mai
S.L. Toh
E. Hendarto
Q. Deng
Y.W. Goh
J.L. Cai
Y.Z. Ma
H.B. Lin
L. Zhu
J. Yu
H.L. Li
Q.F. Wang
R. He
H. Tan
J. Lam
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Citations (2)
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