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L. Zhu
L. Zhu
Chartered Semiconductor Manufacturing
Materials science
Leakage (electronics)
Nanoprobing
Computer science
Salicide
4
Papers
3
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Challenges Facing the Detection of Leakage Current in Integrated Circuit (IC) Devices
2009
S.L. Toh
E. Hendarto
J. Sudijono
P.K. Tan
Y.W. Goh
H.B. Lin
Q. Deng
H. Tan
L. Zhu
Q.F. Wang
H.L. Li
R. He
J. Lam
Z.H. Mai
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Electrical Characterization of Different Failure Modes in Sub-100 nm Devices Using Nanoprobing Technique
2009
E. Hendarto
S.L. Toh
J. Sudijono
P.K. Tan
H. Tan
Y.W. Goh
L. Zhu
Q. Deng
H.B. Lin
R. He
H.L. Li
Z.H. Mai
J. Lam
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Electrical characteristics of leakage issues caused by defective Ni salicide
2009
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
S.L. Toh
P.K. Tan
E. Hendarto
Q. Deng
H.B. Lin
Y.W. Goh
L. Zhu
H. Tan
Q.F. Wang
R. He
Jeffrey Lam
L.C. Hsia
Z.H. Mai
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Physical Failure Analysis Techniques and Studies on Vertical Short Issue of 65nm Devices
2008
P.K. Tan
Z.H. Mai
S.L. Toh
E. Hendarto
Q. Deng
Y.W. Goh
J.L. Cai
Y.Z. Ma
H.B. Lin
L. Zhu
J. Yu
H.L. Li
Q.F. Wang
R. He
H. Tan
J. Lam
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Citations (2)
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