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Physical Failure Analysis Techniques and Studies on Vertical Short Issue of 65nm Devices
Physical Failure Analysis Techniques and Studies on Vertical Short Issue of 65nm Devices
2008
P.K. Tan
Z.H. Mai
S.L. Toh
E. Hendarto
Q. Deng
Y.W. Goh
J.L. Cai
Y.Z. Ma
H.B. Lin
L. Zhu
J. Yu
H.L. Li
Q.F. Wang
R. He
H. Tan
J. Lam
Keywords:
Failure analysis
Reliability engineering
Computer science
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