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Tai-Ju Chen
Tai-Ju Chen
United Microelectronics Corporation
Electronic engineering
Standby power
Logic gate
Transistor
Resistive random-access memory
4
Papers
14
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An Experimental Approach to Characterizing the Channel Local Temperature Induced by Self-Heating Effect in FinFET
2018
IEEE Journal of the Electron Devices Society
E. Ray Hsieh
Meng-Ru Jiang
Jian-Li Lin
Steve S. Chung
T. P. Chen
Shih An Huang
Tai-Ju Chen
Osbert Cheng
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Citations (5)
A Novel Approach to Localize the Channel Temperature Induced by the Self-heating Effect in 14nm High-k Metal-gate FinFET
2018
EDTM | IEEE Electron Devices Technology and Manufacturing Conference
E. R. Hsieh
M. J. Jiang
Hua-Mao Chen
Jian-Li Lin
Steve S. Chung
T. P. Chen
Y. H. Yeah
Tai-Ju Chen
Osbert Cheng
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A 14-nm FinFET Logic CMOS Process Compatible RRAM Flash With Excellent Immunity to Sneak Path
2017
IEEE Transactions on Electron Devices
E. Ray Hsieh
Yen Chen Kuo
Chih-Hung Cheng
Jing Ling Kuo
Meng-Ru Jiang
Jian-Li Lin
Hung-Wen Chen
Steve S. Chung
Chuan Hsi Liu
T. P. Chen
Shih An Huang
Tai-Ju Chen
Osbert Cheng
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Citations (6)
First demonstration of flash RRAM on pure CMOS logic 14nm FinFET platform featuring excellent immunity to sneak-path and MLC capability
2017
VLSIT | Symposium on VLSI Technology
E. R. Hsieh
Y.C. Kuo
Chun-Hu Cheng
J. L. Kuo
Meng-Ru Jiang
Jian-Li Lin
H.-W. Cheng
Steve S. Chung
Chuan Hsi Liu
T. P. Chen
Y. H. Yeah
Tai-Ju Chen
Osbert Cheng
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Citations (3)
1