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Y. H. Yeah
Y. H. Yeah
United Microelectronics Corporation
Electronic engineering
Standby power
Engineering
Logic gate
Transistor
2
Papers
3
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0
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A Novel Approach to Localize the Channel Temperature Induced by the Self-heating Effect in 14nm High-k Metal-gate FinFET
2018
EDTM | IEEE Electron Devices Technology and Manufacturing Conference
E. R. Hsieh
M. J. Jiang
Hua-Mao Chen
Jian-Li Lin
Steve S. Chung
T. P. Chen
Y. H. Yeah
Tai-Ju Chen
Osbert Cheng
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First demonstration of flash RRAM on pure CMOS logic 14nm FinFET platform featuring excellent immunity to sneak-path and MLC capability
2017
VLSIT | Symposium on VLSI Technology
E. R. Hsieh
Y.C. Kuo
Chun-Hu Cheng
J. L. Kuo
Meng-Ru Jiang
Jian-Li Lin
H.-W. Cheng
Steve S. Chung
Chuan Hsi Liu
T. P. Chen
Y. H. Yeah
Tai-Ju Chen
Osbert Cheng
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Citations (3)
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