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I. Meric
I. Meric
Intel
Electronic engineering
Transistor
Engineering
Electronic circuit
Threshold voltage
3
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27
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Transistor reliability characterization and modeling of the 22FFL FinFET technology
2018
IRPS | International Reliability Physics Symposium
C.-Y. Su
M. Armstrong
Lei Jiang
S. A. Kumar
C. D. Landon
S. Liu
I. Meric
K. W. Park
L. Paulson
Kinyip Phoa
Bernhard Sell
J. Standfest
K. B. Sutaria
J. Wan
Dave Young
S. Ramey
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Transistor reliability characterization and comparisons for a 14 nm tri-gate technology optimized for System-on-Chip and foundry platforms
2016
IRPS | International Reliability Physics Symposium
C. Prasad
K. W. Park
M. Chahal
I. Meric
S. Novak
S. Ramey
P. Bai
Hsu-Yu Chang
N. L. Dias
Walid M. Hafez
C-H Jan
Nidhi Nidhi
Roman W. Olac-Vaw
Rahul Ramaswamy
Curtis Tsai
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Citations (14)
Aging model challenges in deeply scaled tri-gate technologies
2015
IIRW | International Integrated Reliability Workshop
S. Ramey
Y. Lu
I. Meric
S. Mudanai
S. Novak
C. Prasad
J. Hicks
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Citations (7)
1