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Dave Young
Dave Young
Intel
Electronic engineering
Transistor
Engineering
Soldering
Ball grid array
3
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18
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Transistor reliability characterization and modeling of the 22FFL FinFET technology
2018
IRPS | International Reliability Physics Symposium
C.-Y. Su
M. Armstrong
Lei Jiang
S. A. Kumar
C. D. Landon
S. Liu
I. Meric
K. W. Park
L. Paulson
Kinyip Phoa
Bernhard Sell
J. Standfest
K. B. Sutaria
J. Wan
Dave Young
S. Ramey
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Citations (6)
Package induced stress impact on transistor performance for ultra-thin SoC
2015
IRPS | International Reliability Physics Symposium
Md. Enamul Kabir
Dave Young
Bahattin Kilic
Ioan Sauciuc
Carl Sapp
Gerald S. Leatherman
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Citations (1)
Slow Cycle Fatigue Creep Performance of Pb-Free (LF) Solders
2007
ECTC | Electronic Components and Technology Conference
Vasu Vasudevan
Xuejun Fan
Tao Liu
Dave Young
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Citations (11)
1