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S. Novak

Intel

6

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87

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Aging model challenges in deeply scaled tri-gate technologies

2015 IIRW | International Integrated Reliability Workshop
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Transistor reliability variation correlation to threshold voltage

2015 IRPS | International Reliability Physics Symposium
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Transistor aging and reliability in 14nm tri-gate technology

2015 IRPS | International Reliability Physics Symposium
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Novel Charge Pumping method applied to tri-gate MOSFETs for reliability characterization

2015 IIRW | International Integrated Reliability Workshop
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