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Kristof Paredis

Katholieke Universiteit Leuven

45

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Understanding the effect of confinement in scanning spreading resistance microscopy measurements

2020 Journal of Applied Physics
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The impact of focused ion beam induced damage on scanning spreading resistance microscopy measurements.

2020 Scientific Reports
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Surface analysis in the semiconductor industry: Present use and future possibilities

2020 Surface and Interface Analysis
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Ferroelectricity in Si-Doped Hafnia: Probing Challenges in Absence of Screening Charges

2020 Nanomaterials
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Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography

2019 AIP Advances
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Nanoscale Localization of an Atom Probe Tip through Electric Field Mapping

2019 The Journal of Physical Chemistry
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3D-carrier Profiling and Parasitic Resistance Analysis in Vertically Stacked Gate-All-Around Si Nanowire CMOS Transistors

2019 IEDM | International Electron Devices Meeting
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Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformity

2018 Nanotechnology
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Fabrication of magnetic tunnel junctions connected through a continuous free layer to enable spin logic devices

2018 Japanese Journal of Applied Physics
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3D構造のためのドーパント,組成とキャリアプロファイリング【Powered by NICT】

2017 Materials Science in Semiconductor Processing
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