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Jose J. Estabil
Jose J. Estabil
Metrology
Design for manufacturability
Engineering
CMOS
Ring oscillator
4
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12
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First Look at Across-chip Performance and Process Noise Using Non-Contact, Performance-Based Metrology
2006
Advanced Semiconductor Manufacturing Conference
Majid Babazadeh
Bertrand Borot
Wim Doedel
Jose J. Estabil
Jean Galvier
Gloria Johnson
Nader Pakdaman
Gary L. Steinbrueck
James S. Vickers
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Citations (2)
First Look at Across-chip Performance Variation Using Non-Contact, Performance-Based Metrology
2006
ASMC | Advanced Semiconductor Manufacturing Conference
Majid Babazadeh
Gloria Johnson
James Vickers
Jose J. Estabil
Nader Pakdaman
Gary L. Steinbrueck
Bertrand Borot
Wim Doedel
Jean Galvier
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Technique pour evaluer la fabrication d'une plaquette et d'un composant semi-conducteur
2004
Majid Aghababazadeh
Jose J. Estabil
Nadar Pakdaman
Gary L. Steinbrueck
James S. Vickers
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Electromigration and current-carrying implications for aluminum-based metallurgy with tungsten stud via interconnections
1993
Hazara Singit Rathore
Ronald G. Filippi
Richard A. Wachnik
Jose J. Estabil
Thomas Kwok
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