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Hazara Singit Rathore
Hazara Singit Rathore
IBM
Electromigration
Tungsten
Current density
Diffusion barrier
Aluminium
1
Papers
9
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Electromigration and current-carrying implications for aluminum-based metallurgy with tungsten stud via interconnections
1993
Hazara Singit Rathore
Ronald G. Filippi
Richard A. Wachnik
Jose J. Estabil
Thomas Kwok
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Citations (9)
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