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Adwoa Akuffo
Adwoa Akuffo
Howard University
Electronic engineering
PIN diode
Materials science
Stacking fault
Diode
6
Papers
13
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Experimental Evaluation of SiC PiN Diode Forward Bias Degradation and Long Term Stability
2007
PESC | Power Electronics Specialists Conference
Madelaine Hernandez-Mora
Adwoa Akuffo
Colleen E. Hood
Jose M. Ortiz-Rodriguez
Allen R. Hefner
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Citations (4)
Characterization of SiC PiN diode forward bias degradation
2004
Allen R. Hefner
Ty McNutt
Adwoa Akuffo
Ranbir Singh
C.H. Ellenwood
Dave Berning
Mrinal K. Das
Joseph J. Sumakeris
Robert E. Stahlbush
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Characterization of SiC PiN diode forward bias degradation
2004
IAS | IEEE Industry Applications Society Annual Meeting
Allen R. Hefner
Ty McNutt
Adwoa Akuffo
Ranbir Singh
C.H. Ellenwood
Dave Berning
Mrinal K. Das
Joseph J. Sumakeris
Robert E. Stahlbush
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Citations (5)
The Role of Carrier Lifetime in Forward Bias Degradation of 4H-SiC PiN Diodes
2004
Materials Science Forum
Allen R. Hefner
Ty McNutt
David W. Berning
R. Singh
Adwoa Akuffo
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The Role of Carrier Lifetime in Forward Bias Degradation of 4H-SiC PiN Diodes | NIST
2003
Allen R. Hefner
Ty McNutt
David W. Berning
Ranbir Singh
Adwoa Akuffo
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