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The Role of Carrier Lifetime in Forward Bias Degradation of 4H-SiC PiN Diodes
The Role of Carrier Lifetime in Forward Bias Degradation of 4H-SiC PiN Diodes
2004
Allen R. Hefner
Ty McNutt
David W. Berning
R. Singh
Adwoa Akuffo
Keywords:
Stacking fault
Engineering physics
Degradation (geology)
High voltage
Carrier lifetime
Electronic engineering
Composite material
Materials science
PIN diode
reverse recovery
Correction
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