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Dave Berning
Dave Berning
National Institute of Standards and Technology
Electronic engineering
Stacking fault
Ranging
Power electronics
Common emitter
3
Papers
9
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Characterization of SiC PiN diode forward bias degradation
2004
Allen R. Hefner
Ty McNutt
Adwoa Akuffo
Ranbir Singh
C.H. Ellenwood
Dave Berning
Mrinal K. Das
Joseph J. Sumakeris
Robert E. Stahlbush
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Characterization of SiC PiN diode forward bias degradation
2004
IAS | IEEE Industry Applications Society Annual Meeting
Allen R. Hefner
Ty McNutt
Adwoa Akuffo
Ranbir Singh
C.H. Ellenwood
Dave Berning
Mrinal K. Das
Joseph J. Sumakeris
Robert E. Stahlbush
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Citations (5)
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