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Jack Hager
Jack Hager
Thermo Fisher Scientific
Electronic engineering
Microscopy
Engineering
Metrology
Transmission electron microscopy
2
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2
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CD-TEM: Characterizing impact of TEM sample preparation on CD metrology
2018
ASMC | Advanced Semiconductor Manufacturing Conference
Anne Kenslea
Chris Hakala
Zhenxin Zhong
Yinggang Lu
John Fretwell
Jack Hager
Chris Kang
Haiyan Tan
Weihao Weng
Laurent Dumas
Irene Brooks
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Team Dynamics at Initech
2017
Darden Business Publishing Cases
Lynn Isabella
Steve Jackson
Jack Hager
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