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Giancarlo Castaneda

STMicroelectronics

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Characterization Methodology for MOSFET Local Systematic Variability in Presence of Statistical Variability

2014 Journal of Low Power Electronics
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Test structures for interdie variations monitoring in presence of statistical random variability

2012 ICMTS | International Conference on Microelectronic Test Structures
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Improved precision methodology for access resistance extraction using Kelvin test structures

2012 ICMTS | International Conference on Microelectronic Test Structures
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