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Shiori Saga
Shiori Saga
Optoelectronics
Physics
Leakage (electronics)
Integrated circuit
Cutoff frequency
3
Papers
13
Citations
0
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A ${c}$ -Axis-Aligned Crystalline In-Ga-Zn Oxide FET With a Gate Length of 21 nm Suitable for Memory Applications
2019
IEEE Journal of the Electron Devices Society
Hitoshi Kunitake
Kazuaki Ohshima
Kazuki Tsuda
Noriko Matsumoto
Tatsuki Koshida
Satoru Ohshita
Hiromi Sawai
Yuichi Yanagisawa
Shiori Saga
Ryo Arasawa
Takako Seki
Ryunosuke Honda
Haruyuki Baba
Daigo Shimada
Hajime Kimura
Ryo Tokumaru
Tomoaki Atsumi
Kiyoshi Kato
Shunpei Yamazaki
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Citations (4)
High thermal tolerance of 25-nm c-axis aligned crystalline In-Ga-Zn oxide FET
2018
IEDM | International Electron Devices Meeting
Hitoshi Kunitake
Kazuaki Ohshima
Kazuki Tsuda
Noriko Matsumoto
Hiromi Sawai
Yuichi Yanagisawa
Shiori Saga
Ryo Arasawa
Takako Seki
Ryo Tokumaru
Tomoaki Atsumi
Kiyoshi Kato
Shunpei Yamazaki
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Citations (7)
High-temperature Electrical Characteristics of 60nm CAAC-IGZO FET : Comparison with Si FET
2018
Hitoshi Kunitake
Satoru Ohshita
Shiori Saga
Y. Narusawa
N. Ishihara
Honda Ryunosuke
M. Kurata
Tomoaki Atsumi
K. Kato
C. M. Lai
D. Chen
S Yamazaki
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Citations (2)
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