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High-temperature Electrical Characteristics of 60nm CAAC-IGZO FET : Comparison with Si FET
High-temperature Electrical Characteristics of 60nm CAAC-IGZO FET : Comparison with Si FET
2018
Hitoshi Kunitake
Satoru Ohshita
Shiori Saga
Y. Narusawa
N. Ishihara
Honda Ryunosuke
M. Kurata
Tomoaki Atsumi
K. Kato
C. M. Lai
D. Chen
S Yamazaki
Keywords:
Optoelectronics
Materials science
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