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Taehyun An
Taehyun An
Samsung
Electronic engineering
Physics
Logic gate
Transistor
Engineering
5
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31
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직업계 고등학교 기계과 NCS 학습모듈 체제 분석 연구
2020
Taehyun An
Lee Byung-Wook
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An Analysis Study on NCS Learning Module Systems in the Mechanical Department of Vocational High School
2020
Taehyun An
Byungwook Lee
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Reliability characterization of 10nm FinFET technology with multi-V T gate stack for low power and high performance
2016
IEDM | International Electron Devices Meeting
Minjung Jin
Changze Liu
J.S. Kim
Jungin Kim
Hyewon Shim
Kangjung Kim
Gunrae Kim
Soonyoung Lee
Taiki Uemura
Man Chang
Taehyun An
Junekyun Park
Sangwoo Pae
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A practical Si nanowire technology with nanowire-on-insulator structure for beyond 10nm logic technologies
2013
IEDM | International Electron Devices Meeting
Sung-Gi Hur
Jung-Gil Yang
Sang-Su Kim
Dongkyu Lee
Taehyun An
Kab-jin Nam
Seong-Je Kim
Zhenhua Wu
Won-sok Lee
Uihui Kwon
Keun-Ho Lee
Young Kwan Park
Wouns Yang
Jung Dal Choi
Ho Kyu Kang
Eun-Sung Jung
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Active Width Modulation (AWM) for cost-effective and highly reliable PRAM
2012
IEDM | International Electron Devices Meeting
Dae-Won Ha
Kwangseok Lee
K. R. Sim
J. Yu
Su Jin Ahn
Sang-Yoon Kim
Taehyun An
Soo-jin Hong
Seung Kyu Kim
J. W. Lee
Byeung-Chul Kim
Gwan-Hyeob Koh
Seo-Woo Nam
Gi-Tae Jeong
Chilhee Chung
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