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Yuuki Kikuchi
Yuuki Kikuchi
University of Tsukuba
Materials science
Threshold voltage
Physics
Electronic engineering
Degradation (geology)
5
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5
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Advanced Air Gap Formation Scheme Using Volatile Material
2021
IITC | International Interconnect Technology Conference
H. Warashina
Hiroaki Kawasaki
Hiroyuki Nagai
T. Yamaguchi
N. Sato
Yuuki Kikuchi
X. Sun
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Invited) Degradation in HfSiON Film Induced by Electrical Stress Application
2010
Ryu Hasunuma
Chihiro Tamura
Tsuyoshi Nomura
Yuuki Kikuchi
Kenji Ohmori
Motoyuki Sato
Akira Uedono
Toyohiro Chikyow
Kenji Shiraishi
Keisaku Yamada
Kikuo Yamabe
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Characterization of Threshold Voltage Shift by Negative Bias Temperature Stress in HfSiOx Films
2009
Chihiro Tamura
Tomohiro Hayashi
Yuuki Kikuchi
Kenji Ohmori
Ryu Hasunuma
Kikuo Yamabe
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Analyses of Threshold Voltage Shift on Hole Injection in HfSiOx Films
2009
Japanese Journal of Applied Physics
Chihiro Tamura
Tomohiro Hayashi
Yuuki Kikuchi
Kenji Ohmori
Ryu Hasunuma
Kikuo Yamabe
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Reversible and irreversible degradation attributing to oxygen vacancy in HfSiON gate films during electrical stress application
2009
IEDM | International Electron Devices Meeting
Ryu Hasunuma
Chihiro Tamura
Tsuyoshi Nomura
Yuuki Kikuchi
Kenji Ohmori
Motoyuki Sato
Akira Uedono
Toyohiro Chikyow
Kenji Shiraishi
Keisaku Yamada
Kikuo Yamabe
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