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H. Y. Huang
H. Y. Huang
TSMC
Delamination
Materials science
Electronic engineering
Interconnection
Dielectric
2
Papers
3
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0
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A flexible top metal structure to improve ultra low-k reliability
2015
IITC | International Interconnect Technology Conference
K. F. Cheng
C. L. Teng
H. Y. Huang
Hsien-Wei Chen
C.W. Shih
T. H. Liu
Cheng-Hsiung Tsai
C. W. Lu
Y.H. Wu
H.H. Lee
Ming-Han Lee
M.-H. Hsieh
B. L. Lin
Shang-Yun Hou
Chung-Ju Lee
H.H. Lu
Tien-I Bao
Shau-Lin Shue
Chen-Hua Yu
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Interface effect on mn-containing self-formed barrier formation with extreme low-k dielectric integration
2010
IITC | International Interconnect Technology Conference
S. C. Pan
C. C. Chi
C. C. Ko
H. H. Kuo
F. M. Huang
Shou-Chung Lee
M. H. Lin
H. Y. Huang
C. H. Hsieh
S.M. Jeng
Hun-Jan Tao
Min Cao
Y. J. Mii
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Citations (3)
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