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H. Maeda
H. Maeda
Mitsubishi Electric
Electronic engineering
Electrode
Anode
Cathode
High-κ dielectric
4
Papers
43
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Mechanism of pre-annealing effect on electromigration immunity of Al–Cu line
2001
Microelectronics Reliability
Motaharul Kabir Mazumder
S. Yamamoto
H. Maeda
Junko Komori
Yoji Mashiko
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Citations (3)
Application of a hydrogen reference electrode to a solid state water removal device
2000
Journal of Applied Electrochemistry
Shiro Yamauchi
K. Mitsuda
H. Maeda
Osamu Takai
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Citations (6)
Novel stacked capacitor technology for 1 Gbit DRAMs with CVD-(Ba,Sr)TiO/sub 3/ thin films on a thick storage node of Ru
1995
IEDM | International Electron Devices Meeting
Akimasa Yuuki
Mikio Yamamuka
Tetsuro Makita
Tsuyosi Horikawa
Teruo Shibano
N. Hirano
H. Maeda
Noboru Mikami
Kouichi Ono
H. Ogata
H. Abe
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Citations (33)
0.15 μm CMOS process for high performance and high reliability
1994
International Electron Devices Meeting
S. Shimizu
T. Kuroi
Maiko Kobayashi
Takehisa Yamaguchi
T. Fujino
H. Maeda
T. Tsutsumi
Y. Hirose
Shigeru Kusunoki
Masahide Inuishi
Natsuro Tsubouchi
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Citations (1)
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