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0.15 μm CMOS process for high performance and high reliability
0.15 μm CMOS process for high performance and high reliability
1994
S. Shimizu
T. Kuroi
Maiko Kobayashi
Takehisa Yamaguchi
T. Fujino
H. Maeda
T. Tsutsumi
Y. Hirose
Shigeru Kusunoki
Masahide Inuishi
Natsuro Tsubouchi
Keywords:
CMOS
Electronic engineering
Materials science
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