Old Web
English
Sign In
Acemap
>
authorDetail
>
Shota Ohnishi
Shota Ohnishi
Samsung
Engineering
Electronic engineering
Irradiation
Soft error
Static random-access memory
2
Papers
2
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (2)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET
2020
IRPS | International Reliability Physics Symposium
Taiki Uemura
Byungjin Chung
Jeongmin Jo
Hai Jiang
Yongsung Ji
Tae-Young Jeong
Rakesh Ranjan
Young-in Park
Kiil Hong
Seungbae Lee
Hwa-Sung Rhee
Sangwoo Pae
Eun-Cheol Lee
Jaehee Choi
Shota Ohnishi
Ken Machida
Show All
Source
Cite
Save
Citations (2)
Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM
2020
IRPS | International Reliability Physics Symposium
Taiki Uemura
Byungjin Chung
Jeongmin Jo
Hai Jiang
Yongsung Ji
Tae-Young Jeong
Rakesh Ranjan
Seungbae Lee
Hwa-Sung Rhee
Sangwoo Pae
Eun-Cheol Lee
Jaehee Choi
Shota Ohnishi
Ken Machida
Show All
Source
Cite
Save
Citations (0)
1