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Jaehee Choi
Jaehee Choi
Samsung
Electronic engineering
Soft error
Physics
Optoelectronics
Electronic circuit
6
Papers
15
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Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology
2021
IRPS | International Reliability Physics Symposium
Taiki Uemura
Byungjin Chung
Jeongmin Jo
Mijoung Kim
Dalhee Lee
Gunrae Kim
Seungbae Lee
Taesjoong Song
Hwa-Sung Rhee
Brandon Lee
Jaehee Choi
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Citations (1)
Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET
2020
IRPS | International Reliability Physics Symposium
Taiki Uemura
Byungjin Chung
Jeongmin Jo
Hai Jiang
Yongsung Ji
Tae-Young Jeong
Rakesh Ranjan
Young-in Park
Kiil Hong
Seungbae Lee
Hwa-Sung Rhee
Sangwoo Pae
Eun-Cheol Lee
Jaehee Choi
Shota Ohnishi
Ken Machida
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Citations (2)
Technology Scaling Trend of Soft Error Rate in Flip-Flops in $1\times$ nm Bulk FinFET Technology
2018
IEEE Transactions on Nuclear Science
Taiki Uemura
Soonyoung Lee
Udit Monga
Jaehee Choi
Seungbae Lee
Sangwoo Pae
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Citations (5)
Charge-collection modeling for SER simulation in FinFETs
2016
SISPAD | International Conference on Simulation of Semiconductor Processes and Devices
Udit Monga
Jaehee Choi
Jongwook Jeon
Uihui Kwon
Keun-Ho Lee
Seungjin Choo
Taiki Uemura
Soonyoung Lee
Sangwoo Pae
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Citations (6)
1