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Yong Kong. Siew
Yong Kong. Siew
Materials science
Electronic engineering
Metrology
Computer science
Nanowire
3
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3
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Statistical significance of STEM based metrology on advanced 3D transistor structures
2019
Laurens Kwakman
Anne Kenslea
Hayley Johanesen
Jillian Cramer
Michael Strauss
Werner Boullart
Hans Mertens
Yong Kong. Siew
Kathy Barla
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Citations (1)
Evaluation of the accuracy and precision of STEM and EDS metrology on horizontal GAA nanowire devices
2019
Hayley Johanesen
Michael Strauss
Anne Kenslea
Chris Hakala
Laurens Kwakman
Werner Boullart
Hans Mertens
Yong Kong. Siew
Kathy Barla
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Citations (2)
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