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Jillian Cramer
Jillian Cramer
Computer science
Electronic engineering
Metrology
Transistor
Nanowire
2
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1
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Statistical significance of STEM based metrology on advanced 3D transistor structures
2019
Laurens Kwakman
Anne Kenslea
Hayley Johanesen
Jillian Cramer
Michael Strauss
Werner Boullart
Hans Mertens
Yong Kong. Siew
Kathy Barla
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Higher Medication Administration Errors Associated with Automated Dispensing System Usage
2017
Jillian Cramer
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