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Zanfeng Chen
Zanfeng Chen
Electronic engineering
Materials science
Optoelectronics
Degradation (geology)
Negative-bias temperature instability
5
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2
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Reliability Challenges in Advanced Technology Node: from Transistor to Circuit (invited)
2020
SSICT | International Conference on Solid-State and Integrated Circuits Technology
Changze Liu
Pengpeng Ren
Yongsheng Sun
Dan Gao
Weichun Luo
Zanfeng Chen
Yu Xia
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New Challenges of Design for Reliability in Advanced Technology Node (Invited)
2020
EDTM | IEEE Electron Devices Technology and Manufacturing Conference
Changze Liu
Yongsheng Sun
Pengpeng Ren
Dan Gao
Weichun Luo
Zanfeng Chen
Yu Xia
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Chip Variability Mitigation through Continuous Diffusion Enabled by EUV and Self-Aligned Gate Contact
2018
ICSICT | IEEE International Conference on Solid-State and Integrated Circuit Technology
Stéphane Badel
Miao Xu
Xiaolong Ma
Wen Yang
Wei Zheng
Xiangqiang Zhang
Meng Lin
Yong Yu
Wei Wei
Qiuling Zeng
Zanfeng Chen
Xiaowei Zou
Waisum Wong
Yanxiang Liu
Sunhom Steve Paak
Yu Xia
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New Insights into the Off-state Stress Induced Degradation in Ultra-scaled FinFET Technology
2018
ICSICT | IEEE International Conference on Solid-State and Integrated Circuit Technology
Pengpeng Ren
Changze Liu
Canhui Zhan
Dan Gao
Zhenghao Gan
Waisum Wong
Zanfeng Chen
Yu Xia
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The Study on the Variation of NBTI Degradation in highly-scaled FinFET technology
2018
ICSICT | IEEE International Conference on Solid-State and Integrated Circuit Technology
Dan Gao
Changze Liu
Zhenghao Gan
Pengpeng Ren
Canhui Zhan
Waisum Wong
Zanfeng Chen
Yu Xia
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