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Canhui Zhan

8

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Analog IC Aging-induced Degradation Estimation via Heterogeneous Graph Convolutional Networks.

2021 ASP-DAC | Asia and South Pacific Design Automation Conference
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New Insights into the Off-state Stress Induced Degradation in Ultra-scaled FinFET Technology

2018 ICSICT | IEEE International Conference on Solid-State and Integrated Circuit Technology
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New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology

2018 IRPS | International Reliability Physics Symposium
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The Study on the Variation of NBTI Degradation in highly-scaled FinFET technology

2018 ICSICT | IEEE International Conference on Solid-State and Integrated Circuit Technology
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