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K. Kohyama
K. Kohyama
Toshiba
Cell
Molecular biology
Materials science
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SOFTERRORRATEREDUCTION INDYNAMICMEMORYWITHTRENCHCAPACITOR CELL
1986
International Reliability Physics Symposium
H. Ishiuchi
Toshiaki Watanabe
T. Tanaka
K. Kishi
M. Ishikawa
N. Goto
K. Kohyama
H. Nioji
Ozawa Semiconductor
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Soft Error Rate Reduction in Dynamic Memory with Trench Capacitor Cell
1986
IRPS | International Reliability Physics Symposium
H. Ishiuchi
T. Watanabe
T. Tanaka
K. Kishi
M. Ishikawa
N. Goto
K. Kohyama
H. Noji
O. Ozawa
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