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K. Kishi

Toshiba

6

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60

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Novel test structure to study location of breakdown for trench capacitor

1989 ICMTS | International Conference on Microelectronic Test Structures
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SOFTERRORRATEREDUCTION INDYNAMICMEMORYWITHTRENCHCAPACITOR CELL

1986 International Reliability Physics Symposium
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Soft Error Rate Reduction in Dynamic Memory with Trench Capacitor Cell

1986 IRPS | International Reliability Physics Symposium
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Gate Turn-Off Thyristors

1982
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Optoelectronic measurements of prebreakdown current in an air gap

1975 Journal of Applied Physics
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Citations (11)