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Pascal Bichebois

STMicroelectronics

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Reticle Haze: An Industrial Approach

2007
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Analysis of defect to yield correlation on memories: method, algorithms and limits

1997 DFT | Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- Pascal Bichebois
- Pierre Mathery
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Defect detection methodology on the back-end process: a case study

1996
- Herve M. Martin
- Pascal Bichebois
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Impact of physical defects on the electrical working of embedded DRAM with 0.35 /spl mu/m design rules

1996 DFT | Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- Pascal Bichebois
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Citations (3)