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Pascal Bichebois
Pascal Bichebois
STMicroelectronics
Materials science
Wafer
Optics
Scanning electron microscope
Optical microscope
5
Papers
10
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Reticle Haze: An Industrial Approach
2007
Stuart Gough
Xavier Gerard
Pascal Bichebois
A. Roche
Frank Sundermann
Veronique Guyader
Yann Bieron
Jean Galvier
Serge Nicoleau
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Analysis of defect to yield correlation on memories: method, algorithms and limits
1997
DFT | Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Pascal Bichebois
Pierre Mathery
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Impact of physical defects on the electrical working of embedded DRAM with 0.35 /spl mu/m design rules
1996
DFT | Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Pascal Bichebois
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Defect detection methodology on the back-end process: a case study
1996
Herve M. Martin
Pascal Bichebois
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Review and characterization of defects after automatic optical inspection on patterned wafers
1996
Pascal Bichebois
Pascal Perret
Herve M. Martin
Alain Brun
Daniel Burlet
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Citations (1)
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