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H. Lochner
H. Lochner
Audi
Semiconductor
Voltage
Reliability engineering
Engineering
Electronic engineering
5
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14
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Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability.
2019
IRPS | International Reliability Physics Symposium
A. Hirler
A. Alsioufy
J. Biba
T. Lehndorff
D. Lipp
H. Lochner
M. Siddabathula
Stefan Simon
T. Sulima
M. Wiatr
Walter Hansch
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Citations (1)
Effective and combined stressors from multi-dimensional mission profiles for semiconductor reliability
2019
Microelectronics Reliability
A. Hirler
A. Alsioufy
J. Biba
T. Lehndorff
H. Lochner
S. Simon
T. Sulima
W. Thomas
Walter Hansch
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The Impact Ionization MOSFET (IMOS) as low-voltage optical detector
2010
Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment
Martin Schlosser
P. Iskra
Ulrich Abelein
Holger Lange
H. Lochner
T. Sulima
F. Wiest
Thomas Werner Zilbauer
Bernd Schmidt
Ignaz Eisele
W. Hansch
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Citations (10)
1