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A. Alsioufy
A. Alsioufy
Audi
Engineering
Semiconductor
Electronic engineering
Effective stress
Reliability engineering
3
Papers
4
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Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability.
2019
IRPS | International Reliability Physics Symposium
A. Hirler
A. Alsioufy
J. Biba
T. Lehndorff
D. Lipp
H. Lochner
M. Siddabathula
Stefan Simon
T. Sulima
M. Wiatr
Walter Hansch
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Citations (1)
Effective and combined stressors from multi-dimensional mission profiles for semiconductor reliability
2019
Microelectronics Reliability
A. Hirler
A. Alsioufy
J. Biba
T. Lehndorff
H. Lochner
S. Simon
T. Sulima
W. Thomas
Walter Hansch
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Citations (1)
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