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Xisen Hou
Xisen Hou
Materials science
Analytical chemistry
Chemistry
Rutherford backscattering spectrometry
Thin film
5
Papers
13
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Utilizing Roughness Power Spectral Density Variables to Guide Resist Formulation and Understand Impact of Frequency Analysis through Process
2018
Journal of Photopolymer Science and Technology
Charlotte Cutler
Choong-Bong Lee
James W. Thackeray
Chris A. Mack
John Nelson
Jason DeSisto
Mingqi Li
Emad Aqad
Xisen Hou
Tomas Marangoni
Joshua Kaitz
Rochelle Rena
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Citations (2)
Roughness power spectral density as a function of resist parameters and its impact through process
2018
Charlotte Cutler
James W. Thackeray
Jason DeSisto
Choong-Bong Lee
Mingqi Li
Emad Aqad
Xisen Hou
Tomas Marangoni
Joshua Kaitz
Rochelle Rena
Chris A. Mack
John Nelson
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Citations (6)
Characterization of Tris (5-amino-1,10-phenanthroline) Ruthenium(II/III) Polymer Films Using Cyclic Voltammetry and Rutherford Backscattering Spectrometry
2011
International Journal of Chemistry
Kenneth L. Brown
Xisen Hou
Olajide Banks
Kevin A Krueger
Julian Hinson
Graham F. Peaslee
Paul DeYoung
Shannon M Alger
Jessica Benzer
Thomas L Neils
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Citations (5)
Chemically Modified Electrodes: Determining Thin Film Thickness
2011
Xisen Hou
Olajide Banks
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