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J. Hughes
J. Hughes
Motorola
Electronic engineering
Gate oxide
CMOS
Optoelectronics
Engineering
5
Papers
36
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Performance and reliability of sub-100nm TaSiN metal gate fully-depleted SOI devices with high-k (HfO/sub 2/) gate dielectric
2004
VLSIT | Symposium on VLSI Technology
A.V.-Y. Thean
Anne Vandooren
S. Kalpat
Y. Du
I. To
J. Hughes
T. Stephens
B. Goolsby
Ted R. White
Alex Barr
Leo Mathew
M. Huang
S. Egley
M. Zavala
D. Eades
K. Sphabmixay
J. Schaeffer
Dina H. Triyoso
M. Rossow
D. Roan
Daniel Thanh-Khac Pham
Raj Rai
S. Murphy
Billy Nguyen
B.E. White
A. Duvallet
Thuy B. Dao
J. Mogab
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Citations (7)
Multi gated device architectures advances, advantages and challenges
2004
ICICDT | International Conference on IC Design and Technology
Leo Mathew
Yang Du
A.V.-Y. Thean
Michael Sadd
Anne Vandooren
Colita Parker
Tab Stephens
R. Mora
Raghav Rai
M. Zavala
David Sing
S. Kalpai
J. Hughes
R. Shimer
S. Jallepalli
G. Workman
Bruce E. White
Bich Yen Nguyen
A. Mogab
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Citations (2)
Mixed-signal performance of sub-100nm fully-depleted SOI devices with metal gate, high K (HfO/sub 2/) dielectric and elevated source/drain extensions
2003
IEDM | International Electron Devices Meeting
Anne Vandooren
Aaron Thean
Y. Du
I. To
J. Hughes
Tab A. Stephens
M. Huang
S. Egley
M. Zavala
K. Sphabmixay
Alex Barr
Ted R. White
Srikanth B. Samavedam
Leo Mathew
J. Schaeffer
Dina H. Triyoso
M. Rossow
D. Roan
Daniel Thanh-Khac Pham
Raj Rai
Bich Yen Nguyen
B.E. White
Marius K. Orlowski
A. Duvallet
Thuy B. Dao
J. Mogab
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Citations (27)
Root Cause Analysis and Reduction of Off-State Leakage Current to Increase Manufacturability of a HIGFET Device
2003
J. Hughes
E. Huang
J. Apibunyopas
C. Della-Morrow
T. Nilsson
M. Coe
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Dry etch sequencing induced gate oxide degradation due to metallic contamination in 0.25 /spl mu/m CMOS manufacturing
1998
IEDM | International Electron Devices Meeting
J. Hughes
Asanga H. Perera
I. Hernandez
Sanjay Parihar
K. Karupanna
J. Vasek
J. Hanna
A. Nagy
T. Lii
M. Reese
J. Rose
J Arnold
J. Cain
S. Mattay
J Porter
O. Razumovsky
T. Chesnut
A. Kaiser
Stephen S. Poon
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