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Nicolas Cabuil
Nicolas Cabuil
STMicroelectronics
Analytical chemistry
Chemistry
Wafer
Metal
Composite material
4
Papers
11
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In‐line 90 nm Technology Gate Oxide Nitrogen Monitoring With Non‐Contact Electrical Technique
2009
Nicolas Pic
Gennadi Polisski
Emmanuel Paire
Véronique Rizzo
Catherine Grosjean
Benjamin Bortolotti
John D’Amico
Nicolas Cabuil
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Comparison of direct-total-reflection X-ray fluorescence, sweeping-total-reflection X-ray fluorescence and vapor phase decomposition-total-reflection X-ray fluorescence applied to the characterization of metallic contamination on semiconductor wafers
2008
Spectrochimica Acta Part B: Atomic Spectroscopy
Adrien Danel
Nicolas Cabuil
Thierry Lardin
Dominique Despois
M. Veillerot
Charles Geoffroy
Motoyuki Yamagami
Hiroshi Kohno
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Citations (7)
Surface Preparation Challenge on Nitrided Gate oxides
2007
Solid State Phenomena
Philippe Garnier
David Barge
J. Bienacel
Brice Tavel
Nicolas Cabuil
Didier Lévy
K. Barla
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Mapping of Metallic Contamination Using TXRF
2007
Solid State Phenomena
Adrien Danel
Yannick Borde
M. Veillerot
Nicolas Cabuil
H. Kono
Motoyuki Yamagami
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Citations (3)
1