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Thierry Lardin
Thierry Lardin
Analytical chemistry
Wafer
Metal
Transition metal
Nuclear magnetic resonance
2
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7
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0
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Quantitative Analysis of the Metallic Contamination On GaAs and InP Wafers By TXRF and ICPMS Techniques
2013
Hervé Fontaine
Thierry Lardin
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Comparison of direct-total-reflection X-ray fluorescence, sweeping-total-reflection X-ray fluorescence and vapor phase decomposition-total-reflection X-ray fluorescence applied to the characterization of metallic contamination on semiconductor wafers
2008
Spectrochimica Acta Part B: Atomic Spectroscopy
Adrien Danel
Nicolas Cabuil
Thierry Lardin
Dominique Despois
M. Veillerot
Charles Geoffroy
Motoyuki Yamagami
Hiroshi Kohno
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Citations (7)
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