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Yong Chen
Yong Chen
Business International Corporation
Materials science
Analytical chemistry
Optoelectronics
Dielectric
Metrology
4
Papers
4
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Vacuum Ultraviolet Spectrometric Ellipsometry Application to Optical Metrology of High-κ Dielectrics and Metal Gate Materials
2013
Yong Chen
Zhenyu Wu
Yonggen He
Junjie Ye
Zhiming Jiang
Hao Dong
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A Study of SiC:P Selective Epitaxial Growth by Uniform Experimental Design
2013
Yonggen He
Yong Chen
Guohui Cai
Youfeng He
Shaofeng Yu
Jingang Wu
David Wei Zhang
Chenyu Wang
Jiyue Tang
Ganming Zhao
Shiyuan Yang
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Effect of the Interfacial SiO2 Layer on High-k Gate Stacks
2013
Yong Chen
Yonggen He
Hailong Liu
Guobin Yu
Jialei Liu
Zhongshan Hong
Jinhua Ni
Jingang Wu
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HKMG All Last to Meet 20nm Logic Device Challenge
2013
Xinyun Xie
Jianhua Ju
Shaofeng Yu
Fenghua Fu
Jie Zhao
Yong Chen
Huanxin Liu
Ziying Zhang
Qiuhua Han
Weihai Bu
Miao Liao
Yong Li
Jiajia Tao
Jiang Yan
Hong Yang
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