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P. van der Heide
P. van der Heide
Katholieke Universiteit Leuven
Optoelectronics
Oxide
Physics
Electrical conductor
Microscopy
4
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2
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0
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Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides
2021
Solid-state Electronics
Umberto Celano
Y. Lee
J. Serron
C. Smith
Jacopo Franco
K. Ryu
Moon-Deock Kim
Soon Oh Park
Jo-Won Lee
J. M. Kim
P. van der Heide
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Probing the evolution of electrically active defects in doped ferroelectric HfO2 during wake-up and fatigue
2020
VLSIT | Symposium on VLSI Technology
Umberto Celano
Y. H. Chen
A. Minj
K. Banerjee
Nicolo Ronchi
S.R.C. McMitchell
P. Van Marcke
Paola Favia
T. L. Wu
Ben Kaczer
G. Van den bosch
J. Van Houdt
P. van der Heide
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Reverse tip sample scanning for precise and high-throughput electrical characterization of advanced nodes
2019
IEDM | International Electron Devices Meeting
Umberto Celano
Kristof Paredis
Wilfried Vandervorst
P. van der Heide
Thomas Hantschel
T. Boehme
A. Kanniainen
L. Wouters
Hugo Bender
N. Bosman
Chris Drijbooms
S. Folkersma
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Non-filamentary (VMCO) memory: A two-and three-dimensional study on switching and failure modes
2017
IEDM | International Electron Devices Meeting
Umberto Celano
C. Gastaldi
Subhali Subhechha
Bogdan Govoreanu
Gabriele Luca Donadio
Alexis Franquet
Tareq Ahmad
Christophe Detavernier
O. Richard
Hugo Bender
Ludovic Goux
Gouri Sankar Kar
P. van der Heide
Wilfried Vandervorst
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