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S. Folkersma
S. Folkersma
Katholieke Universiteit Leuven
Optoelectronics
Engineering
Protein filament
Electronic engineering
Nanotechnology
2
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10
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0
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Reverse tip sample scanning for precise and high-throughput electrical characterization of advanced nodes
2019
IEDM | International Electron Devices Meeting
Umberto Celano
Kristof Paredis
Wilfried Vandervorst
P. van der Heide
Thomas Hantschel
T. Boehme
A. Kanniainen
L. Wouters
Hugo Bender
N. Bosman
Chris Drijbooms
S. Folkersma
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Retention, disturb and variability improvements enabled by local chemical-potential tuning and controlled Hour-Glass filament shape in a novel W\WO 3 \Al 2 O 3 \Cu CBRAM
2016
VLSIT | Symposium on VLSI Technology
Ludovic Goux
Attilio Belmonte
Umberto Celano
Jiyong Woo
S. Folkersma
C. Y. Chen
A. Redolfi
Andrea Fantini
Robin Degraeve
Sergiu Clima
Wilfried Vandervorst
M. Jurczak
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Citations (10)
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