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Mike von Den Hoff
Mike von Den Hoff
KLA-Tencor
Wafer
Metal gate
Engineering
Logic gate
Gate dielectric
2
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2
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The emergence of inline screening for high volume manufacturing
2021
Oreste Donzella
John C. Robinson
Kara Sherman
Justin Lach
Mike von Den Hoff
Barry Saville
Thomas Groos
Alex Lim
Price David W
Jay Rathert
Chet Lenox
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Defect reduction for 20nm high-k metal gate technology
2015
ASMC | Advanced Semiconductor Manufacturing Conference
Vincent Charbois
Julie Lebreton
Mylène Savoye
Eric Labonne
Antoine Labourier
B. Dumont
Chet Lenox
Mike von Den Hoff
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Citations (2)
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