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Y.-H. Huang
Y.-H. Huang
MediaTek
Electronic engineering
Dielectric
Stress field
Radial stress
Absolute value
3
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18
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Thermal resistance modeling of back-end interconnect and intrinsic FinFETs, and transient simulation of inverters with capacitive loading effects
2016
IEDM | International Electron Devices Meeting
Jhih-Yang Yan
Sun-Rong Jan
Yu-Jiun Peng
H. H. Lin
W. K. Wan
Y.-H. Huang
Bigchoug Hung
K.-T. Chan
Michael Huang
M.T. Yang
C. W. Liu
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Citations (13)
Compact modeling and simulation of TSV with experimental verification
2016
VLSIT | Symposium on VLSI Technology
Jhih-Yang Yan
Sun-Rong Jan
Yi-Chung Huang
Huang-Siang Lan
C. W. Liu
Y.-H. Huang
Bigchoug Hung
K.-T. Chan
Michael Huang
M.T. Yang
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Citations (1)
Asymmetric Keep-Out Zone of Through-Silicon Via Using 28-nm Technology Node
2015
IEEE Electron Device Letters
Jhih-Yang Yan
Sun-Rong Jan
Yi-Chung Huang
Huang-Siang Lan
Y.-H. Huang
Bigchoug Hung
K.-T. Chan
Michael Huang
M.T. Yang
C. W. Liu
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Citations (4)
1