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H.-F. Li
H.-F. Li
State University of New York System
Resistive random-access memory
Electronic engineering
Hafnium compounds
Computer science
Error detection and correction
5
Papers
73
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In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory
2015
IMW | International Memory Workshop
B. L. Ji
H.-F. Li
Q. Ye
S. Gausepohl
S. Deora
D. Veksler
Saikumar Vivekanand
H. Chong
Harlan Stamper
T. Burroughs
C. Johnson
M. Smalley
S. Bennett
V. Kaushik
Joseph Piccirillo
Martin Rodgers
M. Passaro
Michael Liehr
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Citations (7)
In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory
2015
IMW | International Memory Workshop
B. L. Ji
H.-F. Li
Q. Ye
S. Gausepohl
S. Deora
Dmitry Veksler
Saikumar Vivekanand
H. Chong
Harlan Stamper
T. Burroughs
C. Johnson
M. Smalley
Stephen Bennett
V. Kaushik
Joseph Piccirillo
Martin Rodgers
M. Passaro
Michael Liehr
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Citations (8)
Statistical assessment of endurance degradation in high and low resistive states of the HfO 2 -based RRAM
2013
IRPS | International Reliability Physics Symposium
S. Deora
G. Bersuker
M. G. Sung
D. C. Gilmer
P. D. Kirsch
H.-F. Li
H. Chong
S. Gausepohl
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Citations (5)
Methodology for the statistical evaluation of the effect of random telegraph noise (RTN) on RRAM characteristics
2012
IEDM | International Electron Devices Meeting
D. Veksler
G. Bersuker
Bhaswar Chakrabarti
Eric M. Vogel
S. Deora
K. Matthews
D. C. Gilmer
H.-F. Li
S. Gausepohl
P. D. Kirsch
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Citations (41)
Real-time study of switching kinetics in integrated 1T/ HfO x 1R RRAM: Intrinsic tunability of set/reset voltage and trade-off with switching time
2012
IEDM | International Electron Devices Meeting
S. Koveshnikov
K. Matthews
K. Min
D. C. Gilmer
M. G. Sung
S. Deora
H.-F. Li
S. Gausepohl
P. D. Kirsch
R. Jammy
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Citations (12)
1