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C. Johnson
C. Johnson
State University of New York System
Computer science
Electronic engineering
Error detection and correction
Resistive random-access memory
Product design
2
Papers
15
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0
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In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory
2015
IMW | International Memory Workshop
B. L. Ji
H.-F. Li
Q. Ye
S. Gausepohl
S. Deora
D. Veksler
Saikumar Vivekanand
H. Chong
Harlan Stamper
T. Burroughs
C. Johnson
M. Smalley
S. Bennett
V. Kaushik
Joseph Piccirillo
Martin Rodgers
M. Passaro
Michael Liehr
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Citations (7)
In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory
2015
IMW | International Memory Workshop
B. L. Ji
H.-F. Li
Q. Ye
S. Gausepohl
S. Deora
Dmitry Veksler
Saikumar Vivekanand
H. Chong
Harlan Stamper
T. Burroughs
C. Johnson
M. Smalley
Stephen Bennett
V. Kaushik
Joseph Piccirillo
Martin Rodgers
M. Passaro
Michael Liehr
Show All
Source
Cite
Save
Citations (8)
1