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Nishida Akio
Nishida Akio
Electronic engineering
MOSFET
Materials science
Optoelectronics
Noise (radio)
5
Papers
1
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Evaluation of Variability in High-k/Metal-Gate MOSFET using Takeuchi Plot
2011
Mizutani Tomoko
Kumar Anil
Nishida Akio
Takeuchi Kiyoshi
Inaba Satoshi
Kamohara Shiro
Terada Kazuo
Mogami Tohru
Hiramoto Toshiro
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Statistical Analysis of DIBL and Current-Onset Voltage (COV) Variability in Scaled MOSFETs
2011
IEICE technical report. Speech
Kumar Anil
Mizutani Tomoko
Nishida Akio
Takeuchi Kiyoshi
Inaba Satoshi
Kamohara Shiro
Terada Kazuo
Mogami Tohru
Hiramoto Toshiro
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Direct Measurement and Analysis of Static Noise Margin in SRAM Cells Using DMA TEG
2010
Hiramoto Toshiro
Suzuki Makoto
Saraya Takuya
Shimizu Ken
Nishida Akio
Kamohara Shiro
Takeuchi Kiyoshi
Mogami Tohru
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Random Fluctuations in Scaled MOS Devices
2009
International Conference on Simulation of Semiconductor Processes and Devices
Takeuchi Kiyoshi
Nishida Akio
Hiramoto Toshiro
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Present Status and Future Trend of Characteristic Variations in Scaled CMOS
2008
Hiramoto Toshiro
Takeuchi Kiyoshi
Tsunomura Takaaki
Nishida Akio
Kamohara Shiro
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