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Direct Measurement and Analysis of Static Noise Margin in SRAM Cells Using DMA TEG
Direct Measurement and Analysis of Static Noise Margin in SRAM Cells Using DMA TEG
2010
Hiramoto Toshiro
Suzuki Makoto
Saraya Takuya
Shimizu Ken
Nishida Akio
Kamohara Shiro
Takeuchi Kiyoshi
Mogami Tohru
Keywords:
Noise (radio)
Static random-access memory
Electronic engineering
Engineering
static noise margin
Correction
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